Table 2a (cont'd). Statistical summaries: Preliminary tests
(spring 1991)
Box 4
Both probe circuits nulled
152.3 pF circuit
n = 7 C = 154.0 pF
s = 0.54
% standard deviation = 0.3
% error = 1.1
10.6 pF circuit
n = 7 C = 15.9 pF
s = 0.6
% standard deviation = 3.8
% error = 50.0
105.8 pF circuit
n = 8 C = 118.6 pF
s = 0.3
% standard deviation = 0.3
% error = 12.1
Σ = 34.2 n = 9
Overall: Standard deviation:
Average: 3.8%
Σ = 241.9 n = 9
% errors:
Average: 26.9%
Box 2 and 4
Both probe circuits nulled
147.2 pF circuit
n = 12 C = 163.5 pF
s = 4.4
% standard deviation = 2.7
% error = 11.1
94.4 pF circuit
n = 12 C = 121.6 pF
s = 0.59
% standard deviation = 4.8
% error = 28.8
16.1 pF circuit
n = 12 C = 26.1 pF
s = 1.2
% standard deviation = 4.6
% error = 62.1
Σ = 12.1 n = 3
Overall: Standard deviation:
Average: 4.0%
Σ = 102.0 n = 3
% errors:
Average: 34.0%
Box 3
Both probe circuits not nulled
147.2 pF circuit
n = 8 C = 206.3 pF
s = 3.8
% standard deviation = 1.8
% error = 40.1
94.4 pF circuit
n = 8 C = 130.7 pF
s = 1.01
% standard deviation = 0.80
% error = 38.4%
16.1 pF circuit
n = 8 C = 27.1 pF
s = 0.43
% standard deviation = 1.5
% error = 68.3
Σ = 4.1
Overall: Standard deviation:
n=3
Average: 1.4%
Σ = 146.8 n = 3
% errors:
Average: 48.9%
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