Measurement electronics consisting
of two separate circuits but installed
in a single chassis (box). Three such
261.5 Ω
152.3 pF
2.49 K
105.8 pF
8.08 K
10.6 pF
boxes were tested, with each box
containing two separate measuring
circuits. For ease of identification,
the boxes were simply called box 2,
box 3, and box 4. For each box, the
two separate measurement circuits
are called probe 1 circuit and probe
circuit 2.
Test circuits as shown in Figure 3
are identified by their actual capaci-
261 Ω
147.2 pF
2.49 K
94.4 pF
8.07 K
16.1 pF
tance value (152.3 pF, for example).
One box (box 3) was left unnulled
in the second set of tests just to pro-
vide some comparison to the nulled